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dc.contributor.authorLuo, Yang
dc.contributor.authorJagtap, Sandeep
dc.contributor.authorTrollman, Hana
dc.contributor.authorGarcía-García, Guillermo
dc.contributor.authorLiu, Xiaoyan
dc.contributor.authorAbdul Majeed, Anwar P.P.
dc.date.accessioned2025-04-30T10:26:41Z
dc.date.available2025-04-30T10:26:41Z
dc.date.issued2025
dc.identifier.citationPublished version: Luo, Y., Jagtap, S., Trollman, H., Garcia-Garcia, G., Liu, X., P.P. Abdul Majeed, A. (2025). Optimizing Industrial Etching Processes for PCB Manufacturing: Real-Time Temperature Control Using VGG-Based Transfer Learning. In: Chen, W., et al. Selected Proceedings from the 2nd International Conference on Intelligent Manufacturing and Robotics, ICIMR 2024, 22-23 August, Suzhou, China. ICIMR 2024 2024. Lecture Notes in Networks and Systems, vol 1316. Springer, Singapore. https://doi.org/10.1007/978-981-96-3949-6_27es_ES
dc.identifier.urihttps://hdl.handle.net/10481/103869
dc.descriptionThis research was funded by Research Development Fund, Grant Number: RDF-21-01-028; Summer Undergraduate Research Fellowship, Grant Number: SURF-2024-0355; and Project for Centre of Excellence for Syntegrative Education, Grant Number: COESE2324-01-07 of Xi’an Jiaotong-Liverpool University. Guillermo Garcia-Garcia acknowledges the Grant ‘Marie Skłodowska-Curie Actions (MSCA) Postdoctoral Fellowship’ with Grant agreement ID: 101052284.es_ES
dc.description.abstractAccurate temperature control in Printed Circuit Board (PCB) manufacturing is essential for maintaining high-quality etching results. Automated monitoring using machine vision and deep learning offers an effective approach for this task. This study investigated a feature-based transfer learning technique for classifying temperature readiness in infrared images of the etching process. The captured dataset containing 470 ‘Production-Ready’ and 480 ‘Not-Ready’ infrared images of the etchant tank was utilized. Pre-trained Visual Geometry Group (VGG) Convolutional Neural Network (CNN) models, specifically VGG16 and VGG19, were employed to extract discriminative features from these images. Logistic Regression (LR) classifiers were then trained on these features to classify the infrared images. The performance of the VGG16-LR and VGG19-LR pipelines was evaluated on training, validation, and test sets using a 60:20:20 split. While both pipelines achieved 100% accuracy on the training sets, the VGG19 pipeline showed exceptional performance, achieving a validation accuracy of 95%, and a test accuracy of 99%. The VGG16 pipeline also demonstrated robust performance, achieving 96% accuracy on both the validation and test sets. Considering the dimensions and the overall efficiency of the pipeline, it was determined that the VGG19-LR model was appropriate for the captured dataset. The high accuracy indicates that transfer learning is suitable for categorizing temperature fluctuation in infrared thermography, as opposed to training a deep neural network from scratch. Computer vision and deep learning provide automated and precise temperature management during the etching process, leading to enhanced efficiency in PCB manufacturing.es_ES
dc.description.sponsorshipResearch Development Fund, RDF-21-01-028es_ES
dc.description.sponsorshipSummer Undergraduate Research Fellowship, SURF-2024-0355es_ES
dc.description.sponsorshipXi’an Jiaotong-Liverpool University COESE2324-01-07es_ES
dc.description.sponsorship‘Marie Skłodowska-Curie Actions (MSCA) Postdoctoral Fellowship’ 101052284es_ES
dc.language.isoenges_ES
dc.publisherSpringer Naturees_ES
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internacional*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.subjectTemperature Controles_ES
dc.subjectPCB Manufacturinges_ES
dc.subjectTransfer Learninges_ES
dc.subjectInfrared Imaginges_ES
dc.subjectFeature Extractiones_ES
dc.subjectConvolutional Neural Networks (CNN)es_ES
dc.titleOptimizing Industrial Etching Processes for PCB Manu-facturing: Real-Time Temperature Control Using VGG-Based Transfer Learninges_ES
dc.typeconference outputes_ES
dc.rights.accessRightsopen accesses_ES
dc.identifier.doi10.1007/978-981-96-3949-6_27
dc.type.hasVersionAMes_ES


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