@misc{10481/79822,
year = {2023},
month = {1},
url = {https://hdl.handle.net/10481/79822},
abstract = {This paper presents a low-cost, self-recoverable, double-node upset tolerant latch aiming at
nourishing the lack of these devices in the state of the art, especially featuring self-recoverability while
maintaining a low-cost pro le. Thus, this D-latch may be useful for high reliability and high-performance
safety-critical applications as it can detect and recover faults happening during holding time in harsh radiation
environments. The proposed D-latch design is based on a low-cost single event double-node upset tolerant
latch and a rule-based double-node upset (DNU) tolerant latch which provides it with the self-recoverability
against DNU, but paired with a low transistor count and high performance. Simulation waveforms support
the achievements and demonstrate that this new D-latch is fully self-recoverable against double-node upset.
In addition, the minimum improvement of the delay-power-area product of the proposed rule-based design
for the low-cost DNU tolerant self-recoverable latch (RB-LDNUR) is 59%, compared with the latest DNU
self-recoverable latch on the literature.},
organization = {Spanish Government	MCIN/AEI/10.13039/501100011033/FEDER	
PID2020-117344RB-I00},
organization = {Regional Government	P20_00265	
P20_00633	
B-RNM-680-UGR20},
publisher = {IEEE},
keywords = {Delay-power-area product (DPAP)},
keywords = {Double node upsets (DNU)},
keywords = {High impedance state (HIS)},
keywords = {Low cost single event double node upset tolerant (LSEDUT)},
keywords = {Power-delay product (PDP)},
keywords = {Single node upset (SNU)},
keywords = {Soft error (SE)},
title = {Rule-Based Design for Low-Cost Double-Node Upset Tolerant Self-Recoverable D-Latch},
doi = {10.1109/ACCESS.2022.3233812},
author = {Hatefinasab, Seyedehsomayeh and Morales Santos, Diego Pedro and Castillo Morales, María Encarnación and Rodríguez Santiago, Noel},
}