@misc{10481/71547,
year = {2018},
month = {1},
url = {http://hdl.handle.net/10481/71547},
abstract = {A multivariate analysis of the parameters that characterize the reset process in RRAMs has been performed. The different correlations obtained can help to shed light on the current components that contribute in the Low Resistance State (LRS) of the technology considered. In addition, a screening method for the Quantum Point Contact (QPC) current component is presented. For this purpose the second derivative of the current has been obtained using a novel  numerical  method  which  allows  determining  the  QPC  model parameters. Once the procedure is completed, a whole RS series of thousands of  curves  is  studied  by  means  of  a  genetic  algorithm.  The  extracted  QPC parameter distributions are characterized in depth to get information about the filamentary pathways associated with LRS in the low voltage conduction regime.},
organization = {Spanish  Ministry  of  Economy  and Competitiveness TEC2014-52152-C3-2-R , MTM2013-47929-P (also supported by the FEDER  program)},
organization = {IMB-CNM  Spanish Ministry of Economy and Competitiveness TEC2014-52152-C3-1-R and TEC2014-54906-JIN (supported by the FEDER  program)},
organization = {ENIAC  Joint Undertaking-PANACHE project.},
organization = {Spanish ICTS Network MICRONANOFABS},
publisher = {AIP Publishing},
keywords = {Resistive switching memory},
keywords = {RRAM},
keywords = {Quantum Point Contact Model},
keywords = {Conductive filaments},
keywords = {Parameter extraction},
title = {Multivariate analysis and extraction of parameters in resistive RAMs using the Quantum Point Contact model},
doi = {https://doi.org/10.1063/1.5006995},
author = {Roldán Aranda, Juan Bautista and Miranda, E. and González Cordero, Gerardo and García Fernández, Pedro and Romero Zaliz, Rocio Celeste and González Rodelas, Pedro and Aguilera Del Pino, Ana María and González, M. B. and Jiménez Molinos, Francisco},
}