@misc{10481/69355,
year = {2020},
month = {5},
url = {http://hdl.handle.net/10481/69355},
abstract = {The  homogeneity  problem  for  testing  if  more  than  two  different  samples  come  from  the  same  population  is  consideredfor  the  case  of  functional  data.  The  methodological  results  are  motivated  by  the  study  of  homogeneity  of  electronic  devicesfabricated  by  different  materials  and  active  layer  thicknesses.  In  the  case  of  normality  distribution  of  the  stochastic  processesassociated with each sample, this problem is known as Functional ANOVA problem and is reduced to test the equality of themean  group  functions  (FANOVA).  The  problem  is  that  the  current/voltage  curves  associated  with  Resistive  Random  AccessMemories (RRAM) are not generated by a Gaussian process so that a different approach is necessary for testing homogeneity.To  solve  this  problem  two  different  parametric  and  nonparametric  approaches  based  on  basis  expansion  of  the  sample  curvesare proposed. The first consists of testing multivariate homogeneity tests on a vector of basis coefficients of the sample curves.The second is based on dimension reduction by using functional principal component analysis of the sample curves (FPCA) andtesting multivariate homogeneity on a vector of principal components scores. Different approximation numerical techniques areemployed to adapt the experimental data for the statistical study. An extensive simulation study is developed for analyzing theperformance  of  both  approaches  in  the  parametric  and  non-parametric  cases.  Finally,  the  proposed  methodologies  are  appliedon three samples of experimental reset curves measured in three different RRAM technologies.},
organization = {IMB-CNM (CSIC) (Barcelona)},
organization = {Spanish Ministry of Science, Innovation and Universities (FEDER, Spain program) TEC2017-84321-C4-3-R MTM2017-88708-P IJCI-2017-34038},
organization = {Government  of  Andalusia (Spain) (FEDER  program)  A.TIC.117.UGR18},
organization = {PhD grant (Spain) FPU18/01779},
publisher = {Elsevier},
keywords = {Karhunen-Loève expansion},
keywords = {Basis expansion of curves},
keywords = {P-splines},
keywords = {Homogenecity test},
keywords = {Resistive switching memory},
keywords = {Functional data analysis},
title = {Homogeneity problem for basis expansion of functional data with applications to resistive memories},
doi = {https://doi.org/10.1016/j.matcom.2020.05.018},
author = {Aguilera Del Pino, Ana María and Acal González, Christian José and Aguilera Morillo, María del Carmen and Jiménez Molinos, Francisco and Roldán Aranda, Juan Bautista},
}