TY  - JOUR 
AU  - Romero Cáceres, Adrián
AU  - Jiménez Tejada, Juan Antonio
AU  - González Peñalver, Jesús
AU  - Deen, M. Jamal
PY  - 2021
UR  - https://hdl.handle.net/10481/77759
AB  - In this work, we propose an unified compact model, which includes the effects of both source and drain contact regions, to describe the electrical characteristics of staggered thin film transistors (TFTs). The model is based on a generic drift...
LA  - eng
PB  - Elsevier
KW  - Compact modeling
KW  - contact resistance
KW  - evolutionary parameter extraction method
KW  - modeling contact effects
KW  - thin-film transistors (TFTs)
TI  - Unified electrical model for the contact regions of staggered Thin Film Transistors
DO  - 10.1016/j.orgel.2021.106129
ER  -