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dc.contributor.authorAcal González, Christian José 
dc.contributor.authorAguilera Del Pino, Ana María 
dc.contributor.authorAlonso, Francisco Javier
dc.contributor.authorRuiz-Castro, Juan Eloy 
dc.contributor.authorRoldán Aranda, Juan Bautista 
dc.date.accessioned2024-04-29T06:43:07Z
dc.date.available2024-04-29T06:43:07Z
dc.date.issued2024-04-27
dc.identifier.citationMathematics and Computers in Simulation, 223 (2024) 288-298es_ES
dc.identifier.urihttps://hdl.handle.net/10481/91206
dc.description.abstractThis paper is motivated by modeling the cycle-to-cycle variability associated with the resistive switching operation behind memristors. Although the data generated by this stochastic process are by nature current–voltage curves associated with the creation (set process) and destruction (reset process) of a conductive filament, the statistical analysis is usually based on analyzing only the scalar time series related to the reset and set voltages/currents in consecutive cycles. As the data are by nature curves, functional principal component analysis is a suitable candidate to explain the main modes of variability associated with these processes. Taking into account this data-driven motivation, in this paper we propose two new forecasting approaches based on studying the sequential cross-dependence between and within a multivariate functional time series in terms of vector autoregressive modeling of the most explicative functional principal component scores. The main difference between the two methods lies in whether a univariate or multivariate PCA is performed so that we have a different set of principal component scores for each functional time series or the same one for all of them. Finally, the sample performance of the proposed methodologies is illustrated by an application on a bivariate functional time series of reset/set curves.es_ES
dc.description.sponsorshipUniversidad de Granada / CBUAes_ES
dc.language.isoenges_ES
dc.publisherElsevieres_ES
dc.titleDifferent PCA approaches for vector functional time series with applications to resistive switching processeses_ES
dc.typeinfo:eu-repo/semantics/articlees_ES
dc.relation.projectIDMCIN/AEI/10.13039/501100011033es_ES
dc.relation.projectIDCEX2020-001105-M/AEI/10.13039/501100011033es_ES
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesses_ES
dc.identifier.doihttps://doi.org/10.1016/j.matcom.2024.04.017
dc.type.hasVersioninfo:eu-repo/semantics/publishedVersiones_ES


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